Synchrotron Beamlines
Analytical Instruments
- >Surface analysis
  - KNTOF-1800
  - FIB-TOF-SIMS
- >Environmental analysis
  - Jet-REMPI
  - LICA-MS
  - RTM-MS
Accelerator Components
Thin Film Deposition
Semiconductor Technology
Vacuum Chambers
- >Permalloy Chambers
  - Permalloy Chambers
Vacuum Components
Special projects
- >Examples
  - Examples

Hard X-Ray Free Electron Laser Beamline - XFEL

Beam Monitors

The XFEL beam has very high specification beam characteristics which require measurement and monitoring systems. Beam profile, position and current monitors are installed in the XFEL. These monitor the transverse beam profile, the temporal bunch structure, the beam position, beam charge and beam arrival timing at each stage.

Beam Profile Monitor

This beam profile monitor can measure very small beam sizes up to approximately 100µm. Toyama has installed these in the accelerator and undulator sections of XFEL as well as in the experimental beamline, a total of 43 monitors.

CT-type Beam Current Monitor

This is a core monitor with four terminal outputs to measure the current of the accelerating electron beam. These are installed in the accelerator and undulator sections of XFEL as well as in the experimental beamline, a total of 30 current monitors.