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Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometer FIB-TOF-SIMS

FILMER - high resolution surface analysis and microscopy system

Features | Specification | Photos | Data1 | Data2 | Example1 | Example2 | Example3

Compatibility between High Lateral Resolution and Mass Resolution

FILMER data

 

Comparison between SIMS and Laser SNMS images

FILMER data

Analysis of a blend polymer of polystyrene and polyhydrostyrene showing the nano scale mapping of the phase separated structure of the organic polmer mixture.

 

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