Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometer FIB-TOF-SIMS
FILMER - high resolution surface analysis and microscopy system
Features | Specification | Photos | Data1 | Data2 | Example1 | Example2 | Example3
Example: Suspended Particulate Matter
Samples of suspended particulate matter collected near the Toyama R&D center on Si-wafers set on a polycarbonate filter in a PM2.5 standard sampler.