Cryogenic Probing Stations
Features | Specifications| Photos
Features
Cryogenic 4 probe system during
system test in the factory
A Wide Temperature Range Type Cryogenic Probing Station for SiC devices that enables continuous measurements to be made over a wide temperature range from 40K to 770K under the same conditions.
This has been developed through the combination of technology for cryogenic probing stations and a newly developed high-performance heat switch (ATECS: Advanced Thermal Expanded Contact System) which enables measurement in both low and high temperature conditions. This allows low temperatures to be used for the testing of basic characteristics and then high temperature for reliability testing, without having to change the sample preparation.
Temperature range
Drawing of system - click image to enlarge